Detalhe da pesquisa
1.
Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.
Rapid Commun Mass Spectrom
; 29(23): 2204-10, 2015 Dec 15.
Artigo
em Inglês
| MEDLINE | ID: mdl-26522311
2.
Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.
Anal Chem
; 85(10): 5064-70, 2013 May 21.
Artigo
em Inglês
| MEDLINE | ID: mdl-23590425